Abstract
Machining chips of commercially pure titanium (ASTM Grade 2) were recycled into fully dense bulk material by equal channel angular pressing (ECAP). The morphology of the oxide layer derived from chip surfaces was characterized by focused ion beam miller and transmission electron microscopy. Electron backscatter diffraction and chemical analysis were used to propose quantitatively a complex strengthening mechanism considering interstitials, ultrafine grains (with misorientation ≥15 deg), and subgrains (<15 deg) substantially in existence after ECAP.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
