A PVT resilient true‐time delay cell

Abstract

AbstractA true‐time delay (TTD) cell in TSMC 0.18 μm CMOS technology for 1–5 GHz applications is presented. Process variations, ageing effects, field variations, and other non‐idealities have some impacts on the TTD cell's devices. One of the vulnerable specifications of TTD cells is their delay variation. While the TTD cell works in a delay line, the cell must have a constant and robust delay in the frequency band. For this matter, the body bias technique is presented and applied to the inductor‐less TTD cell. With this technique, the threshold voltage can be manipulated intentionally. So, any variation in this voltage can be compensated with the body biasing of transistors. The simulation results show the TTD cell's robust performance against non‐idealities, while delay variation improves more than 3× times in the frequency band of interest. This TTD cell provides a 50.95 pS delay with only 2% variation, while S11 and S22 parameters are lower than −10 dB in the 1–5 GHz frequency band. IIP3 of the TTD cell is about 2.7 dBm, and the power consumption is 20.5 mW.