Abstract
ABSTRACT A prototype of beam profile measurement system developed by the Institute of Modern Physics, which can work in the proportional region and ionization region, respectively, by adjusting the pressure and voltage, has been tested several times and achieved the design expectation. When the working pressure of the detector is low enough, the system can work in the secondary electron mode to measure the fast extraction beam profile too. The measurement system has been used to measure the profile of carbon ion beam in the Second Radioactive Ion Beam Line in Lanzhou in slow extraction mode and fast extraction mode, respectively. It is confirmed that the measurement system can measure the profile of carbon ion beam with a dynamic range of beam intensity up to six orders of magnitude. We used the X-ray beam to simulate the Gaussian-like distribution for laboratory testing, and the results show that the measurement system has a better resolution than 0.1 mm for the beam position with a Sigma of about 1.6 mm. This measurement system, together with the harps measurement system, will be able to meet needs of most beam profile measurements in High energy Fragment Separator (HFRS) at High Intensity heavy-ion Accelerator Facility (HIAF).
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