Abstract
The functions and requirements for an interface between a microprocessor-based test system controller and a digital ‘unit under test’ are investigated in this paper. Two approaches of testing are compared and discussed: 1. (1) The dynamic test concept which exercises the ‘unit under test’ at its fastest rate by storing the test sequence and results in a fast buffer storage and :- 2. (2) The semi-dynamic test which eliminates the requirement for buffer storage by analyzing the test data on a real-time basis.
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