Abstract
This paper presents a probabilistic approach for the susceptibility assessment of a straight printed-circuit-board trace in the presence of a random electromagnetic field, which is essentially modeled as a plane wave with parameters (magnitude, polarization angle, direction-of-arrival angles) treated as random variables. Closed-form expressions are derived for the probability density function of the induced far-end voltage in certain cases of field descriptions (excitation scenarios). An easy-to-apply Monte–Carlo approach is employed for comparison and verification purposes, but also to cope with scenarios that are not analytically tractable.
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