Abstract

CONTEXT: Just-in-Time defect prediction is to specify the suspicious code commits that might make a product cause defects. Building JIT defect prediction models require a commit history and their fixed defect records. The shortage of commits of new projects motivated research of JIT cross-project defect prediction (CPDP). CPDP approaches proposed for component-level defect prediction were barely evaluated under JIT CPDP. OBJECTIVE: To explore the effects of CPDP approaches for component-level defect prediction where JIT CPDP is adopted. METHOD: A case study was conducted through two commit dataset suites provided in past studies for JIT defect prediction. JIT defect predictions with and without 21 CPDP approaches were compared regarding the classification performance using AUC. The CPDP approaches were also compared with each other. RESULTS: Most CPDP approaches changed the prediction performance of a baseline that simply combined all CP data. A few CPDP approaches could improve the prediction performance significantly. Not a few approaches worsened the performance significantly. The results based on the two suites could specify two CPDP approaches safer than the baseline. The results were inconsistent with a previous study. CONCLUSIONS: CPDP approaches for component-level might be effective for JIT CPDP. Further evaluations were needed to bring a firm conclusion.

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