Abstract
A method for measuring half lives in the range of μsec to msec using repeated pulse height analysis during successive time intervals in connection with pulsed activation is reviewed. This method is compared to the standard method of time analysis and checked for a possible loss of information. If transitions are measured whose energy is not known beforehand the method of successive pulse height analysis may be preferred, trading some loss of accuracy of the half life against the advantage of simultaneously finding and measuring the photo-peak of the transition.
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