Abstract

A lifetime spectrometer for use with an isotope-based DC positron beam is described. The system utilizes secondary electrons emitted from the sample and annihilation gamma rays to determine positron lifetimes. The device has been tested with porous silica films capped with a 25 nm layer of Cu. For positron implantation energies between 1.7 and 15 keV, the time resolution was found to be between 985 and 425 ps, respectively.

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