Abstract
A physics-based model and the corresponding solution methodology for the mobile-ionic (MI) dielectrics exhibiting Q-V(Charge-Voltage) hysteresis behaviors are proposed based on ion drift-diffusion (IDD) equations coupling with Poisson's equation. The proposed model captures the dynamic distribution of mobile ions' concentrations within dielectric along the external electric field. The accuracy of the proposed model is validated by comparing the computed results with the experimental ones.
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