Abstract
The technique commonly used for the analysis of data from broad-band X-ray imaging systems for plasma diagnostics is the filter ratio method. This requires the use of two or more broad-band filters to derive temperatures and line-of-sight emission integrals or emission measure distributions as a function of temperature. Here we propose an alternative analytical approach in which the temperature response of the imaging system is matched to some physical parameter which the experimenter wishes to investigate. We have calculated the temperature response of a system designed to measure the total radiated power along the line of sight of any coronal structure. Other examples are discussed.
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