Abstract
To meet growing demands on a phase noise test solution for high volume radio frequency integrated circuits (RFICs), a phase noise analyzer based on a delay line FM demodulator operating at an intermediate frequency (IF) has been developed as an extension to an existing mixed-signal/wireless IC tester. The significant results from this effort are twofold. Firstly, the results from the first two devices show that it offers a unique set of performance trade-offs among accuracy, capital cost, throughput & measurement variance expected from the high volume production environment. Secondly, a detailed examination of IF based delay line FM demodulator revealed a significant set of instrumentation & calibration design issues which have not been fully explored by the previous works on this topic.
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