Abstract
We model degradation in extended two-dimensional solar cells. The model couples electrical and thermal physics, so that voltage and temperature can vary over a device. Degradation is modeled phenomenologically, such that local open circuit voltage degradation is dependent on local temperature. Initial device nonuniformity is introduced with an initial spatial distribution of random shunt conductances. A comparison of pre- to post-stress performance shows variations, despite the deterministic nature of the degradation model, which is interpreted as a consequence of temperature variations.
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