A novel VLSI processor for high-rate, high resolution spectroscopy

Abstract

A novel time-variant VLSI shaper amplifier, suitable for multi-anode Silicon Drift Detectors or other multi-element solid-state X-ray detection systems, is proposed. The new read-out scheme has been conceived for demanding applications with synchrotron light sources, such as X-ray holography or EXAFS, where both high count-rates and high-energy resolutions are required. The circuit is of the linear time-variant class, accepts randomly distributed events and features: a finite-width (1–10 μs) quasi-optimal weight function, an ultra-low-level energy discrimination (∼150 eV), and a full compatibility for monolithic integration in CMOS technology. Its impulse response has a staircase-like shape, but the weight function (which is in general different from the impulse response in time-variant systems) is quasi trapezoidal. The operation principles of the new scheme as well as the first experimental results obtained with a prototype of the circuit are presented and discussed in the work.