A Novel Two-Peak Analysis for Dielectric Spectroscopy

Abstract

This paper describes a method for estimating model parameters $\varepsilon _{s}$ and $\Delta \varepsilon = \varepsilon _{s} - \varepsilon _{\infty }$ from the peaks in the imaginary permittivity and loss-tangent spectra. The analysis describes how measured parameters obtained from an impedance spectrometer, the magnitude of the impedance, and phase angle, are directly converted into complex permittivity and loss tangent. As an application, the method is used to detect and quantify the crystallization of skim-milk powder, which shows a dramatic change in the Debye parameters as it converts from the amorphous to crystalline state.