Abstract

We apply time-domain spectroscopy (THz) imaging technology to perform nondestructive detection on three industrial ceramic matrix composite (CMC) samples and one silicon slice with defects. In terms of spectrum recognition, a low-resolution THz spectrum image results in an ineffective recognition on sample defect features. Therefore, in this article, we propose a spectrum clustering recognition model based on t-distribution stochastic neighborhood embedding (t-SNE) to address this ineffective sample defect recognition. Firstly, we propose a model to recognize a reduced dimensional clustering of different spectrums drawn from the imaging spectrum data sets, in order to judge whether a sample includes a feature indicating a defect or not in a low-dimensional space. Second, we improve computation efficiency by mapping spectrum data samples from high-dimensional space to low-dimensional space by the use of a manifold learning algorithm (t-SNE). Finally, to achieve a visible observation of sample features in low-dimensional space, we use a conditional probability distribution to measure the distance invariant similarity. Comparative experiments indicate that our model can judge the existence of sample defect features or not through spectrum clustering, as a predetection process for image analysis.

Highlights

  • Nondestructive testing is one of the most significant applications of terahertz technology, and terahertz time-domain spectroscopy (THz—TDS) system is a commonly used technique [1, 2]

  • In order to improve the efficiency of t-distribution stochastic neighborhood embedding (t-stochastic neighbor embedding (SNE)), the principal components analysis (PCA) method is usually introduced first to reduce the dimension of a high-dimensional sample point data set to 50 dimensions, and t-SNE is used for cluster recognition. e specific pseudocode is shown in Algorithm 1

  • The data set of abnormal spectrum is significantly smaller than that of normal structure samples and is in free state, and the results are in line with the predicted analysis

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Summary

A Novel THz Differential Spectral Clustering Recognition Method Based on t-SNE

In terms of spectrum recognition, a low-resolution THz spectrum image results in an ineffective recognition on sample defect features. Erefore, in this article, we propose a spectrum clustering recognition model based on t-distribution stochastic neighborhood embedding (t-SNE) to address this ineffective sample defect recognition. We propose a model to recognize a reduced dimensional clustering of different spectrums drawn from the imaging spectrum data sets, in order to judge whether a sample includes a feature indicating a defect or not in a lowdimensional space. We improve computation efficiency by mapping spectrum data samples from high-dimensional space to low-dimensional space by the use of a manifold learning algorithm (t-SNE). Comparative experiments indicate that our model can judge the existence of sample defect features or not through spectrum clustering, as a predetection process for image analysis

Introduction
Experiment and Analysis
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