Abstract
Gas Electron Multiplier (GEM) detectors are widely used for tracking and imaging applications due to their excellent position resolution and high efficiency, among other factors. The present study aims to assess the position resolution by employing a novel method that utilizes a high-precision instrument for source movement. The results demonstrate that the double GEM can accurately determine positions with sigma values of up to 36.8 μm and 54.6 μm in the x and y directions, respectively. Additionally, other standard characterizations, such as energy resolution, gain uniformity, and charge spread, were evaluated experimentally and found to be consistent with existing literature. A Garfield simulation was also performed to validate the experimental charge spread results.
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