A Novel Sub-Pixel-Shift-Based High-Resolution X-ray Flat Panel Detector

Abstract

In this paper, we describe a novel sub-pixel shift (SPS)-based X-ray flat panel detector (FPD), which can achieve high resolution while maintaining a high SNR (signal-to-noise ratio). In the proposed architecture, an XY precision shift stage is applied to complete the sub-pixel shift process. In addition, image acquisition and high-resolution image composition are integrated in the FPD hardware. According to the relevant standards for detector image quality evaluation, we tested and evaluated some image quality indicators. The results show that the proposed FPD with SPS outperforms the original FPD without SPS technology. More specifically, the measured pixel size of the proposed FPD was reduced from 162 to 140 μm for 2 × 2 sub-pixel shift mode, and 132 μm for 4 × 4 sub-pixel shift mode, that is, the basic spatial detector resolution was improved by 13.6% for the simplest 2 × 2 sub-pixel shift mode, and by 18.5% for 4 × 4 sub-pixel shift mode. With this method, a lower-price FPD is elevated both in resolution and SNRn to meet imaging quality requirements.