Abstract
This paper presents a novel semiconductor switch test platform for power converter optimization which allows to test power semiconductors under different switching current waveforms. As switching current has a major influence on the switching behavior of power semiconductors and thus on switching losses. Compared with conventional double pulse test circuit which can only test power semiconductors under linear current waveform, the proposed test platform can provides programmable current source by controlling the switches. Experimental results measured from SiC MOSFET have verified the effectiveness of the test platform over conventional circuits.
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