A novel reliability-based optimal design of electromagnetic devices based on adaptive dynamic Taylor Kriging

Abstract

This paper proposes an efficient reliability-based optimization algorithm based on adaptive dynamic Taylor Kriging (ADTK). In the ADTK model, the basis functions are optimally selected by binary particle swarm optimization algorithm and the minimal number of sampling data with a desired fitting error is decided. To evaluate the reliability performance, the sensitivity assisted Monte Carlo simulation method is employed, where the constraint functions are constructed by the ADTK surrogate model.