Abstract
By evaluating LEED intensities from different diffraction beams taken only at discrete energy intervals (which may be as large as 15–20 eV) the same degree of reliability in surface structure determination can be reached as with the conventional techniques based on analysis of continuous I V -spectra. The minimum of the corresponding R-factor can be found by a least-squares fit method, as will be exemplified with a system in which 8 structural parameters were subject to simultaneous refinement.
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