Abstract
Abstract A novel NDE technique, known as capacitive imaging (CI), is introduced in this work. The CI approach uses a coplanar probe with two or more electrodes in air to produce a quasi-static electric field distribution within the material. The capacitive coupling allows this technique to detect both surface and hidden defect in insulating materials, and provide indications of surface profile of conducting materials. Scanning the electrodes over the material can form an image according to the changes in the output voltage from the coplanar CI probe. In this work, a detailed description of the CI technique is presented, including the theory, modes of operation, instrumentation, and some preliminary experimental results.
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