A novel methodology in fabricating dielectric reflectors for the desired wavelength spectrum using sol-gel spin coating technique

Abstract

The use of passive photonic devices such as dielectric reflectors in electronics to replace semiconductor technology is being extensively researched. Dielectric reflectors with the required stop band are in high demand as smart windows, visual light communication boosters, and UV radiation defenders. The determination of a single approach for the envisioned wavelength spectrum of a dielectric reflector is unique and original. We offer a unique approach for synthesizing and developing dielectric reflectors in the required wavelength domain. The constructed reflectors were examined using XRD, which indicated the anatase phase of TiO2 in the multilayer structure. Cross-sectional FE-SEM examination revealed periodic bright (TiO2) and dark (SiO2) bands, and thickness analysis demonstrated that increasing the spin rate can lower the film thickness of the produced films. In addition, reflectance analysis on the structures using a UV-VIS-NIR spectrophotometer demonstrated that increasing the film thickness of the multilayer structure can move the reflectance band towards higher wavelengths.