A novel method to obtain electronic speckle pattern interferometry fringe patterns with high contrast

Abstract

Traditional speckle fringe patterns of electronic speckle pattern interferometry (ESPI) are obtained by adding, subtracting, or multiplying the speckle patterns recorded before and after the deformation. However, these speckle fringe patterns are of limited visibility, especially for addition and multiplication fringe patterns. We propose a novel method to obtain speckle fringe patterns of ESPI from undeformed and deformed speckle patterns. The fringe pattern generated by our method is of high contrast and has better quality than subtraction fringe. The new method is simple and does not require more computational effort. The proposed method is tested on the experimentally obtained undeformed and deformed speckle patterns. The experimental results illustrate the performance of this approach.