Abstract
Spatial resolution enhancement of microwave radiometer measurements is addressed using a new method that is based on an $L^{p}$ penalisation approach with a variable $p$ exponent. The key idea is letting $p$ to vary in the range 1.2 - 2 to take benefit of both Hilbert (i.e. $p=2)$ and Banach (i.e. $p=1.2)$ advantages. Results, obtained processing both simulated and actual Special Sensor Microwave Imager (SSM/I) measurements, demonstrate the benefits of the proposed approach in reconstructing abrupt discontinuities and smooth gradients with respect to approaches in Hilbert and Banach spaces.
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