Abstract
The electrical property in arc column plays a fundamental role in understanding, controlling, and developing arc processes. In this study, a novel dual active probe method is proposed to measure the arc conductivity, as measured by the voltage-to-current ratio (V-I ratio), and study its electrical property distribution. The probes were partially coated except for their tips such that the electrical conductivity can be accurately tested with fine resolution. During test, the two probes moved into the arc column to detect the V-I ratio of selected zone between the probe tips. Since the speed of the movement is relatively slow, the moving probes are expected to have no significant interruption to the arc. The effect of the probe rotation angular velocity was examined. It was found that with the decrease of probe angular velocity, the instantaneous V-I ratio of the arc between two probes firstly decreases and then tends to be constant. Analysis suggests that the dynamics of the detection circuit is responsible. The testing current applied and the application positions (probe tips), as parameters of the detection circuit, were then analyzed using the circuit model. This novel method provides an effective new approach to study fundamental properties of welding.
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