Abstract
In this paper, a new method for measuring surface charge density by means of Pockels effect and optic phase compensation is presented. Totally different from current measuring methods, this new measuring probe is made of Pockels crystal and the principle of the measurement is based on optical phase compensation. This problem brings much less disturbance to the surface charge density, especially, one on a conductor surface and the measuring result is easily obtained by readings from a voltmeter.
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