Abstract
Chemically strengthened glass is widely used for screen protection in mobile devices, and its strengthening processes and application fields have rapidly diversified. The origin of the strength is residual compressive stress induced by ion exchange, and the stress evaluation has been performed via the photoelastic effect. However, for a deep understanding of the nature of the strength and development of stronger glasses, we need a method directly connected to atomic-scale glass structures. Here, we propose a method based on the “stuffing” effect, where we can determine the residual stress non-contactively and non-destructively with a high spatial resolution using Boson, D1, D2, and A1 peaks in micro-Raman spectra. Finally, we show a plausible depth dependence of the residual stress.
Highlights
Strengthened glass is widely used for screen protection in mobile devices, and its strengthening processes and application fields have rapidly diversified
These two values are obtained from a depth profiling of stress via the photoelastic effect[18]; e.g., stress evaluation devices based on both the photoelastic effect and the waveguide effect have been commercialized and used as a standard technique
The methods based on the photoelastic effect are suitable to conveniently determine compressive stress (CS) and depth of layer (DOL), but there is an issue, i.e., we cannot find out correlation between the CS and atomicscale glass structures
Summary
Strengthened glass is widely used for screen protection in mobile devices, and its strengthening processes and application fields have rapidly diversified. Alkali ion exchange between the parent glasses and the molten salt, e.g., Na+ to K+, occurs by diffusion At this time, the immersing temperature (approximately 400 °C) is kept lower than the glass transition temperature, so that the aluminosilicate network is hardly relaxed, which leads to the compression of the glass network. I.e., the maximal CS and the depth of layer (DOL)[3,17], are used to check the quality of the chemically strengthened glass, where the latter can be defined as the depth at which the residual stress equals zero These two values are obtained from a depth profiling of stress via the photoelastic effect[18]; e.g., stress evaluation devices based on both the photoelastic effect and the waveguide effect have been commercialized and used as a standard technique. It is significant that we directly evaluate the CS from the glass structures, which can lead to deep understanding of the strength by ion exchange and the development of stronger glass
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