Abstract
Voltage fluctuation and voltage flicker as indexes of power quality (PQ) have been attracting more and more attentions. In this paper, a novel method based on the wavelet threshold de-noising technology and the Prony analysis for flicker measurement is introduced. Firstly, an improved wavelet threshold de-noising technology is used to pretreat the data of voltage flicker signal. Then the Prony algorithm is adopted to extract the amplitudes, frequencies, and phase angles of all frequency components of the voltage flicker signal. Finally, reconstructing voltage flicker signal and constructing its orthogonal signal as linear combination of sinusoids, the envelope of the voltage flicker signal is obtained by the principle of envelop detection.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
