Abstract

With the development of communication technology has come several measurement applications requiring plane-wave conditions for wireless-device characterizations in anechoic chambers. In this paper, a metasurface lens with a 2 × 2 feeding-antenna array is proposed and characterized to synthesize a plane wave in a near field for a fifth-generation (5G) millimeter-wave radio-frequency (RF) devices test. The metasurface lens, based on Jerusalem-cross elements printed on a printed circuit board (PCB) substrate, is used for controlling the phase-shift distribution of incident spherical waves. The lens has a size of 0.4 × 0.4 m and is designed to operate at a range from 24.25 GHz to 27.5 GHz, and its feeding-antenna array is located at a focal plane of the lens, which is parallel to the metasurface lens. The lens is studied and verified through simulations and experiments, and a uniform amplitude and phase-field distribution at a reduced distance of 1.2 m generated by the metasurface lens throughout a QZ are achieved. The worst-case amplitude and phase variation of the designed metasurface lens are ±0.75 dB and ±7.5°, respectively. The results show a plane-wave condition can be achieved in 5G millimeter bands through the proposed compact and effective metasurface lens. Moreover, the proposed metasurface lens is shown to be capable of reducing the plane-wave synthesizing distance compared to the compact antenna test range (CATR) with a significantly reduced system cost, making it an attractive alternative to antenna testing in 5G millimeter-wave frequency bands.

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