Abstract

A new technical method is developed for soft X-ray spectroscopy of near-edge x-ray absorption fine structure (NEXAFS). The measurement is performed with continuously rotating linearly polarized light over 2π, generated by a segmented undulator. A demonstration of the rotational NEXAFS experiment was successfully made with a 2D film, showing detailed polarization-dependence in intensity of the molecular orbitals. The present approach provides varieties of technical opportunities that are compatible with the state-of-the-art experiments in nano-space and under the operando condition.

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