Abstract

The Conventional Complementary Metal Oxide Semiconductor Field Effect Transistor (CMOSFET) design techniques have limitations in designing the Integrated Circuit (ICs), especially with memories of multiple valued logic (MVL) in nanotechnologies. FinFET technologies provide the possibilities of low logic gates and small chip areas with high speed. Memories play an essential role in all types of devices. This paper aims to optimize the power and increase the speed of the SRAM Cell and Array using different techniques in 18nm FinFET technology. The presence of a ternary input provides an additional degree of freedom for the operation of the memory cell. The SRAM cells are also implemented at a Quantum level to improve the results in terms of area, energy, and speed. Simulation and Analysis of the design is done using Cadence Virtuoso Analog Design Environment Tool and Quantum Dot Cellular Automata Designer Tool. The proposed Multi-Threshold Complementary MOS (MTCMOS) based SRAM Array design exhibits an improvement of 4.56% in power consumption and 19.29% in speed as compared to a Conventional CMOS SRAM Array. The proposed ternary implementation of the MTCMOS-based SRAM cell is found to have a 24.9% reduction in power consumption and a 39% improvement in speed as compared to the proposed conventional ternary CMOS SRAM array while SRAM cell latency is 1 clock cycle. It occupies an area of 0.04 µm2 and consists of 33 quantum cells. The average energy dissipation of this SRAM cell is found to be 40% better than the latest existing literature for the design.

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