Abstract
AbstractThe random exfoliation at very positive potentials (>5 V vs Li/Li+) of graphite (used as a conductive component in positive electrodes of lithium‐ion batteries) was investigated with in situ Raman microscopy and post mortem scanning electron microscopy (SEM). A novel semiautomated computational method for the data analysis of both characterization methods was developed to correlate Raman and SEM information with good lateral resolution, in order to locate exfoliated graphite particles. Proof is given that the exfoliating particles detected via the semiautomatic in situ Raman microscopy mappings correctly describes exfoliated areas, as confirmed via post mortem SEM pictures. Copyright © 2011 John Wiley & Sons, Ltd.
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