Abstract

Broad learning system (BLS) is an effective and efficient incremental learning system without the deep architecture. It has strong feature extraction ability and high computational efficiency. However, it is greatly limited in the applicability of supervised learning. For the collected actual data, more data are unlabeled data and less data are labeled data. To overcome these problems, Fick's law assisted propagation (FLAP) is introduced into the BLS to propose a new semi-supervised classification algorithm, namely FLAP-BLS in this paper. In the FLAP-BLS, the FLAP has the labeled ability from the labeled examples to unlabeled examples, it is used to mark plenty of unlabeled samples by few labeled samples in order to obtain a large number of labeled samples and build the sample data matrix. Then an efficient incremental BLS without deep structure can effectively extract features from large-scale data, it is used to effectively classify the sample matrix. Finally, USPS, MNIST and NORB datasets are selected to validate the effectiveness of the FLAP-BLS. The experiment results show that the FLAP-BLS can effectively classify the few labeled samples and a large of unlabeled samples and obtain classification results with high accuracy, and it has faster classification speed, stronger generalization ability and better stability. The proposed method provides a new method for image classification.

Highlights

  • Classification includes signal classification [1], [2], image classification [3]–[5], mail classification [6], [7] and so on [8]–[11]

  • Compared with Fick’s law assisted propagation (FLAP)-hierarchical extreme learning machine (HELM), FLAP-support vector machine (SVM) and FLAP-kernel extreme learning machine (KELM), the FLAP-Broad learning system (BLS) can obtain the best classification accuracy of 88.95%

  • In this paper, a new semi-supervised classification algorithm based on FLAP and BLS, namlely FLAP-BLS is proposed

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Summary

A Novel Broad Learning Model-Based Semi-Supervised Image Classification Method

JIANJIE ZHENG 1, (Member, IEEE), YU YUAN 2, (Member, IEEE), HUIMIN ZHAO 3,4, AND WU DENG 1,3,5, (Member, IEEE).

INTRODUCTION
A SEMI-SUPERVISED CLASSIFICATION METHOD
Findings
CONCLUSIONS AND PROSPECTS
Full Text
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