Abstract
This paper describes a novel duMond-configuration monochromator for high-resolution X-ray diffraction. The device consists of two single-crystal blocks of silicon each containing two beam channels cut respectively parallel to and 17.65° from the (011) planes. In the high-intensity mode, with Cu Kα 1 radiation, the beam divergence is 11.5″ and the dispersion is 1.3×10 -4 with intensity comparable with that from a symmetric Ge 022 device. The high-resolution setting has a divergence of 4.4″ and dispersion of 4.9×10 -5 , the intensity being a factor of ten lower than in the high-intensity setting. Parallel lateral translation of the two elements permits a rapid switch between the high-resolution and high-intensity settings
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