A Novel Approach to Discrimination in X-Ray Spectrographic Analysis

Abstract

AbstractThere are various methods for handling the problem of interferences. One may me one of the weaker lines of the trace clement, but this results in considerable loss in the limit of detectability of this element. One may try pulse height discrimination techniques, but because of the linearity limitations of present day pulse height analyzers, complete elimination of the higher energy wave length is not possible. Another possible technique is to lower the kilovoltage below the excitation potential of the interfering element. This is satisfactory, but again the limit of detectability is raised for the trace element. There are many other “devices” which may be tried, but all of these involve a loss in sensitivity in the determination of the trace element.The “novel” approach involves the use of an analyzing crystal whose second order reflection is missing due to crystal structure considerations. Germanium or silicon, cut so that (111) planes are parallel to the surface of the crystal, would be satisfactory analyzers for this purpose. The use of one of these crystals and the application of this method to the niobium-tantalum and zirconium-hafnium systems are discussed.