A non-intrusive optical (NIO) approach to characterize heliostats in utility-scale power tower plants: Methodology and in-situ validation

Abstract

No reliable in-situ optical characterization tool is available that can efficiently and accurately measure various optical errors of individual heliostats in a utility-scale power-tower plant. Here, an innovative non-intrusive optical (NIO) approach is proposed to measure mirror surface slope error, mirror facet canting error, and heliostat tracking error based on reflection images using the natural target—the tower—in a heliostat field. The NIO approach adopts various techniques in photogrammetry, reflectometry, and geometrical optics to first determine the camera position and the actual tower position with respect to the heliostat. Then, Snell’s law is applied to find the surface normal at the reflection point or line of a reflection image and derive the surface slope error, mirror facet canting error, and heliostat tracking error accordingly. In addition, an in-situ validation is performed to demonstrate the feasibility of the NIO approach. Analysis with multiple sets of reflection images on one single heliostat of interest demonstrates that the NIO method can achieve a measurement uncertainty of 0.22 mrad for mirror facet slope error (root-mean-square) at the given test conditions. The sensitivity of measurement uncertainty to various parameters will be presented in a separate work. In the future, state-of-the-art unmanned aerial systems (UAS) are planned to perform the efficient image collection with a goal to complete the survey across a utility-scale field of over 10,000 heliostats within one or a few days depending on the number of UASs. The development of the NIO approach is expected to fill the critical gap for successful solar-field operation and maintenance, which is necessary for the global growth of the solar power-tower technology. The NIO approach can also be applied to any relevant industry requiring high-precision mirror surface shape characterization.