Abstract
The structure of the Cu(1 1 1)–(√3×√3) R30°-Cu 2Si surface alloy has been determined using normal incidence X-ray standing wave (NIXSW) analysis. It comprises two equally populated, monolayer thick (√3×√3) R30°-Cu 2Si domains. In one domain the silicon and copper atoms both reside in the fcc type threefold hollows, in the other they both reside in the hcp type threefold hollows. For both domains the silicon atoms are 2.04±0.04 Å from the substrate Cu(1 1 1) scatterer plane.
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