Abstract
Laboratory measurements using both wave probes (contact and optical) and radar confirm the existence of a new type of overshoot phenomenon in the wind‐wave development processes. This type of overshoot which occurs at gravity‐capillary wavelengths is practically a function of local wind stress only. It is named the overshoot phenomenon of the third kind. With the existence of this overshoot it becomes obvious that the past assumed simple power law relationship between the rms value of surface slope at a fixed wavelength and the wind stress is untenable. Since such a relationship is one of the key assumptions invoked in the development of algorithms used to date in scatterometry, we have reexamined the published scatterometer data and pointed out the implications of this overshoot phenomenon. Recommendations for improvement of the performance of the scatterometer are also made in light of our new understanding of the wind‐wave development processes.
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