Abstract
Abstract A new interference fringe type in transmission electron microscopy has been studied. These fringes are observed in a thin martensite plate or bainite plate embedded in a matrix crystal. They have the characteristics of equal-thickness fringes and follow the thickness contours of the martensite or bainite plate. It has been clarified that the displacement caused by lattice shearing on martensitic transformation is responsible for these fringes. The thickness periodicity of fringes has been deduced to be dependent on the amount of the transformation shear, the direction of the shear and the vector of the operating reflection. It also depends weakly on the deviation from the exact diffracting condition. These fringes may be useful for the deduction of the morphology of martensite or bainite plates. They also provide the means of direct measurement of the transformation shear strain.
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