Abstract
SUMMARYThis paper presents a high‐speed, high‐resolution column parallel analog‐to‐digital converter (ADC) with global digital error correction. Proposed A/D converter is suitable for using in high‐frame‐rate complementary metal–oxide–semiconductor (CMOS) image sensors. This new method has more advantages than conventional ramp ADC from viewpoint of speed and resolution. A prototype 11‐bit ADC is designed in 0.25‐µm CMOS technology. Moreover, an overall signal‐to‐noise ratio of 63.8 dB can be achieved at 0.5Msample/s. The power dissipation of all 320 column‐parallel ADCs with the peripheral circuits consume 76 mW at 2.5‐V supplies. Copyright © 2012 John Wiley & Sons, Ltd.
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