A New Technology for Industrial Strain Mapping Using Single-Wall Carbon Nanotube Sensors

Abstract

Measurements of mechanical strain are widely used in heavy industry to design and test new structures and to ensure the safety of installed infrastructure. However, the few practical methods for strain measurement all have serious limitations. To complement these methods, we have developed a new strain technology, called S4 for “strain-sensing smart skin,” which uses single-wall carbon nanotubes (SWCNTs) as microscopic sensors. Nanotubes dilutely embedded in a polymer are applied as a thin film to specimen surfaces of interest. Subsequent strains in the specimen are transmitted by load transfer through the film to the nanotubes, inducing axial compression or extension. Those small structural deformations of the SWCNTs alter the semiconducting band gaps in predictable ways, causing proportional shifts in the peak wavelengths of their near-infrared fluorescence emission. Shifts are quantified by optically exciting the specimen surface and spectrally analyzing the resulting fluorescence to deduce strain values at the probed locations. The S4 method has recently been implemented using hyperspectral imaging. We demonstrate measurements in less than one minute of strain maps containing hundreds of thousands of pixels with 50 microstrain noise levels and 0.2 mm spatial resolution. This technology has promising potential to become a large-scale commercialized application of carbon nanotechnology.