Abstract
A new technique has been developed for direct measurement of the differential X-ray absorption fine structure (XAFS) spectrum by the energy-modulation method. To acquire the energy-oscillating incident X-ray beam, a piezoelectric actuator is used to control the double-crystal monochromator. A logarithmic converter circuit and a lock-in amplifier are used to extract the modulated signals. The normal and differential XAFS spectra of the Mn K-edge of Li2MnO3 have been collected. The X-ray-absorption near-edge-structure (XANES) spectra verify that the signal-to-noise ratio has been greatly improved by the new technique, and the extended X-ray absorption fine structure (EXAFS) spectra demonstrate that this new technique can efficiently enhance the signals of the backscattering atoms.
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