Abstract
This work explores the use of multichannel readout electronics, already in use for quality assurance in gain uniformity studies, to measure the uniformity of the induction gap in Gas Electron Multipliers (GEM) based detectors. The devised procedure also provides a qualification of the readout electrodes in terms of disconnected or shorted channels. The measurement is based on inducing a signal on the readout strips by pulsing the bottom layer of the GEM foil, and measuring the amplitude of the induced signal. In this work, signals are readout using the analog APV25 front-end chip and the Scalable Readout System (SRS) developed by the RD51 collaboration at CERN. Studies on small and large area GEM detectors, effects of mechanical stress, and of electric fields are presented. Sensitivity to defects in the readout plane is also verified.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
