Abstract
A surface impedance function (SIF) appropriate for use on the aperture surface of a conducting body with a dielectric-filled cavity, is presented. Unlike the usual SIFs that might be used on an aperture, this SIF takes into account not only the wave transmitted through the aperture but also the wave reflected from the inside of the cavity the shape of the aperture and cavity, and the polarization and direction of the incident wave. The SIF is derived heuristically from the series-reflection solution for a plane wave normally incident on an infinite flat conducting plate with a flat dielectric coating. The SIF was developed and used in a combined method of moments solution for the scattered fields due to an incident plane wave. This combined technique greatly reduces the number of current expansion coefficients to be determined using the method of moments and hence also reduces the number of impedance elements required for calculation in the method of moments. Application of the SIF in a combined method is illustrated for a two-dimensional object. >
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
