Abstract
In the present work, an easy automatic method based on foil laser scattering measurements is applied to evaluate the induction time ( t i) in CR-39 solid state nuclear track detectors for different etching temperatures. A quantity q, proportional to the amount of suface layer removed is plotted against etching temperature. The experimental results are compared with those obtained from microspectrophotometer measurements for Macrofol-E detectors.
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