A New Recurrence Method for Determining the Green's Function of Planar Structures with Arbitrary Anisotropic Layers (Correction)

Abstract

A method to determine the Green's functions in the spectral domain is developed. It is suitable for solving the matrix Green's function numerically for an arbitrary anisotropic N-layered dielectric structure. The method is suitable for computation of the characteristic parameters of MIC lines having anisotropic multilayered substrates or superstrates. As an application, the phase velocities of single and coupled microstrips, with a constant gradient of anisotropy along the normal to the interfaces, have been calculated.