Abstract
A new microwave dielectric ceramic ErVO4 with a zircon structure was prepared by solid-state reaction method. The structure of ErVO4 was confirmed by X-ray diffraction and TEM diffraction, and no second phase was generated in the ceramic. At different sintering temperatures, slight changes in the lattice parameters affected microwave dielectric properties of the ErVO4 ceramic. Relative density, packing fractions, etc. Were investigated to analyze the variation of dielectric properties. Further the complex chemical bond theory revealed that the dielectric constant had a similar changing trend to the ionicity of bond, while the lattice energy had a positive impact on the quality factor. ErVO4 ceramic sintered at 1150 °C had the microwave dielectric properties of εr = 12.03, Q × f = 25,549 GHz, and τf = −52.89 ppm/°C.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
