Abstract
We describe first experiences with a novel spectromicroscopy set-up — NanoESCA@Elettra — which has been installed at the nanospectroscopy soft x-ray beamline at Elettra (Trieste). The system features an energy-filtered photoemission microscope with a 30 kV immersion lens system and a double-hemispherical energy analyzer. The instrument provides both real space and k-space mapping modes. Experiments on nanostructured samples with laboratory gas discharge sources show a lateral resolution of less than 50 nm and an energy resolution of better than 200 meV. We have also performed first tests of the instrument with synchrotron radiation. [DOI: 10.1380/ejssnt.2011.395]
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