Abstract
In an optical voltage sensor (OVS) based on Pockels effect, there are some inevitable issues in its practical applications, such as vibration effects, aging connections between optical elements, hot expansion and cold contraction of the elements, and so on. These issues can cause a deviation between the optical elements, which affects the internal electric field distributions in the electro-optic crystal. In this paper, the electric field of a multi-segmented Pockels OVS is analyzed, and the result shows when the incident angle or the position of the crystal has a small deviation, the integral voltage error is more than 0.2%, which makes it impossible to accurately meet measuring accuracy. In order to improve the electric field distributions, a new method of quartz crystal (QC) stratification is presented and verified by simulation analysis and experiments. The optimized structure constructed by the new method can reduce the electric field integral error caused by optical path deviation from 0.1971% to 0.0498% and errors caused by crystal deviation from 0.2759% to 0.0098%, thus making it easier to meet the requirement of 0.2% accuracy class (IEC 60044-7-1999).
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
