Abstract
In this paper, a new method is proposed to avoid crowding phenomenon in extracting the permittivity of ferroelectric thin films. Polynomial curve fitting technique is used to determine the filling factor while the thickness of the thin film is very small. Conformal mapping (CM) combining with partial capacitance approach (PTA) is used to obtain the relationshipbetween the effective p ermittivity of multiplayer coplanar waveguide (CPW) and the permittivity of each layer. A CPW with a thin film layer is simulated and the permittivity of thin film is extracted, the results show that, by using the proposed method, the crowding phenomenon can be avoided successfully and the permittivity of thin films can be extracted accurately.
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